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The DII Collaborative Graduate Program for Accelerating Innovation in Future Electronics organizes the "International Workshop on Education and Research for Future Electronics."

[Important] Due to the COVID-19 emergency declarations, we decided to hold the workshop online. Please see below, the details for registration.

In this international workshop, we present the activities in the DII Collaborative Graduate Program for Accelerating Innovation in Future Electronics, one of the Nagoya University's WISE programs (Doctoral Programs for World-leading Innovative & Smart Education) selected by MEXT. We invite Dr. Peter Harries, Dean of the Graduate School, North Carolina State University; Prof.  Yoshio Nishi, Emeritus, Stanford University; Prof. Toshiro Kaneko, Coordinator of WISE Program for AI Electronics, Tohoku University; Prof. Takeo Yamaguchi, Coordinator of Creating sustainable societies through [Material×Information] multi-talented human resource development, Tokyo Institute of Technology; and Prof. Tsunenobu Kimoto, Coordinator of Innovation of Advanced Photonic and Electronic Devices, Kyoto University to discuss the world-leading education accelerating Innovation. Also, we will discuss, through the workshop, what we learned from the COVID-19 pandemic and how we turn the negative experience into a positive one. The graduate students involved in the DII Collaborative Graduate Program will also give presentations.

Participation is free. We welcome everyone, including students, who is interested in education and research for future electronics.

  • Date & Time: Wednesday, January 20, 2020, 9:30 a.m. - 4:30 p.m. (JST, UTC+09:00)
  • Place: Sakata and Hirata Hall, Nagoya University  Online 
  • Fee: Free
  • Registration: Not required  Required (see below)
  • Please see the poster for detailed information

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Poster for International Workshop on Education and Research for Future Electronics

Registration

Please fill out the form below.

The deadline for the registration is January 20, 8:00 a.m. (JST). Late registration may cause delays for acceptance.